ALTAIR-LI Instrumentation Systems

 
 

ALTAIR LI is an advanced system which use an infrared focal plane array camera, capable of producing non contact stress images of structures and materials under cyclic loading. ALTAIR LI uses the thermoelasticity principle together with an highly sensitive infrared focal plane array camera and state of the art digital processing electronics.

 

Applications:
  • Non destructive testing

  • Stress analysis and mechanical testing

  • NInfrared thermomgraphy

  • Research & development

 

Main Features:

 

Silver 450M



Exploit thermoelasticity principle

Allows measuring stress and strain in materials

 

Lockin principle

Enhance the signal to noise ratio

 

Random signals inputs

Allows testing sith real excitation signals

 

Motion compensation

Compensate for large piece displacements during testing